Laboratory of Electron and Optical Microscopy
Institute of Physical Chemistry, Bulgarian Academy of Sciences
High-resolution imaging up to 100,000×.
Advanced FEG-SEM imaging of materials and biological samples using multiple detectors (SE, BSE, UED).
Detailed surface morphology, microstructure analysis and imaging of complex structures with high spatial resolution.
Elemental analysis including light elements.
Dual EDS detectors (100 mm² each) enable precise compositional analysis for all elements including carbon.
Point analysis, line scans and elemental mapping for interface studies and multilayer systems.
2D and 3D imaging with confocal and light microscopy.
Bright field, dark field, differential interference contrast and confocal imaging using ZEISS systems.
Surface topography, roughness analysis and non-destructive thickness measurements.
Ion beam cross-section polishing.
Precision preparation using JEOL IB-19530CP ion cross-section polisher.
Ideal for multilayers, coatings and thin films, enabling artefact-free interface analysis.
The Laboratory of Electron and Optical Microscopy and Microanalysis at the Institute of Physical Chemistry (Bulgarian Academy of Sciences) is the first electron microscopy service laboratory within BAS.
For more than 50 years, we support scientific research and industrial applications, providing advanced imaging, microanalysis and consultancy services.
High-resolution imaging of materials and biological samples with advanced detectors.
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Elemental mapping and line scan analysis for compositional profiling.
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Confocal and classical microscopy for 2D/3D surface characterization.
Learn more →High-resolution visualization of micro- and nanostructures: In-chamber and In-column SEI/BEI detectors reveal the structure in detais at high magnifications
Carbon screen printed electrodes, modified with Pd or Au nanoparticles for ethanol oxidation reaction mag × 100 K Courtesy: Prof. V. Tsakova, IPC, BAS
Anodized Al folia mag × 200 K Courtesy: Prof. B. Tsaneva, TU-Sofia
Thin films and nanostructured materials mag × 200 K Courtesy: Prof. L. Kolaklieva, CLAP-BAS, Plovdiv
Revealing the hidden structure
Elemental mapping and compositional analysis of complex materials
Energy-dispersive X-ray spectroscopy (EDS) enables elemental identification, mapping and line profiling, providing insight into the composition and distribution of elements in multilayer systems and advanced materials.
Optical microscopy - reflected/transmitted light, scanning laser confocal microscopy of complex materials
Zeiss Stemi305, Zeiss Axioscope5 and Zeiss LSM900: bright field, dark field, differential interferential contrast and circular-differential interferential contrast. Reliable and suitable for broad range of studies in materials science, including crystal growth grains, phase boundaries, morphology of surfaces, thin films, defects and interstitials.
Institute of Physical Chemistry
Bulgarian Academy of Sciences
Laboratory of Electron/Optical Microscopy
Sofia-1113
Acad. G. Bonchev Str., bl. 11, floor 4
Tel: +359 2979 2533
📍 Open in Google Maps
