X-ray diffractometer Philips PW1050
Recording of single diffractogram: 50 BGN
Phase pattern determination: 5 BGN/phase
Determination of crystallite size: 20 BGN
Quantitative phase analysis: 20 BGN
Indexing of unknown phase: 150 BGN
Specialized research:
- Determination of residual stress by two-axis method: 200 BGN
- Determination of crystallographic texture – recording of pole figure: 100 BGN
- Diffractogram by small-angle diffraction (0.5 2θ): 60 BGN
Prices do not include 20% VAT.
X-ray diffractometer Empyrean and X-ray microtomograph Bruker SkyScan 1272
Institutions and companies outside IPC-BAS may use the X-ray diffractometer Empyrean and X-ray microtomograph Bruker SkyScan 1272 under the conditions of the procedure for granting financial assistance BG161PO003-1.2.04 “Development of applied research in research organizations in Bulgaria” of EU Operational Program “Development of the Competitiveness of the Bulgarian Economy” 2007 – 2013.
Request for investigations should be sent to:
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X-ray diffrection studies: Res. Assistant. Eng. Georgi Avdeev, PhD Institute of physical chemistry - BAS Room: 127/426 Тel: 02-979-2534 e-mail: g_avdeev@abv.bg, g_avdeev@ipc.bas.bg |
X-ray tomography studies: Assistant Prof. Dragomir Tatchev, PhD Institute of physical chemistry - BAS Room: 108/515 Тel: 02-979-2570; 02-979-3585; 02-872-0021 e-mail: dtachev@ipc.bas.bg |
The laboratory offers remote use, taking samples sent by postal delivery at: Institute of Physical Chemistry – BAS, Acad. G. Bonchev Str. bl. 11, Sofia 1113, Bulgaria. Measurement protocols and the results will be provided by e-mail or by granting FTP access to a local computer.
download Apllication form and Rates (doc in BG)