Equipment

X-ray diffractometer Empyrean:

 

 

Capabilities:

  1. Diffraction from polycrystalline samples
    • Powder samples. Used for: phase analysis including quantitative, crystallite size determination, indexing of unknown compounds, structure refinement
    • Bulk ceramic and metallic samples. Used for: phase analysis including quantitative, crystallite size determination, indexing of unknown compounds.
  2. Small angle diffraction (0.5 2θ). Used for: investigation of zeolites, clays organic crystals.
  3. Diffraction from sample in capillary. Used for:  investigation of small quantities of the sample, sols, gels, liquids and substances unstable in normal conditions. Diffraction measurements of non-structured powder samples.
  4. Grazing incident x-ray diffraction (GID). Used for:  phase analysis of thin films including multilayers.
  5. Small angle x-ray scattering, (SAXS). Used for: characterization of nanoparticles in bulk samples, sols, gels or liquids.
  6. Diffraction from bulk samples with weight up to 3 kg. Used for: phase analysis of finished products such as parts and assemblies.
  7. Microdiffraction. Used for: phase analysis of samples which surface have varying chemical and phase composition. Diffraction from uneven surfaces.
  8. Reflectometry. Used for: determination of thickness of thin films in the range 1-100 nm.
  9. Investigation of crystallographic texture.
  10. Determination of residual stress
  11. High temperature (up to 1600оС) investigations in air, vacuum or inert atmosphere.
  12. Pair distribution function (PDF) analysis.

Laboratory 127

 

The purchase of the device was supported by the project: “Hi-tech laboratory for advanced X-ray methods and tomography for the development of eco- and energy-saving technologies and technologies related to health” is implemented with the financial support of Operational Program “Development of the Competitiveness of the Bulgarian Economy” 2007 – 2013.

Laboratory 426

 

 

 

 

 

X-ray diffractometer Philips PW1050

 

 


Capabilities:

 

  1. Diffraction from polycrystalline samples
    • Powder samples. Used for: phase analysis including quantitative, crystallite size determination, indexing of unknown compounds, structure refinement
    • Bulk ceramic and metallic samples. Used for: phase analysis including quantitative, crystallite size determination, indexing of unknown compounds.
  2. Investigation of crystallographic texture.
  3. Determination of residual stress
  4. Small angle diffraction (0.5 2θ). Used for: investigation of zeolites, clays organic crystals.
  5. Determination of Pair distribution function (PDF).

 

X-ray microtomograph Bruker SkyScan 1272

 

Capabilities:

Non-destructive volume (3D) visualization of the microstructure of a wide range of solid materials, biological materials, microelectronic components and others. Quantification of porosity (open and closed), volume fraction and size distribution of voids and inclusions. Determination of thickness, area of ​​internal surfaces and interphase boundaries and others. Detection of defects.

The device has a microfocus X-ray tube with operating voltage between 20 and 100 kV and CCD detector with physical pixel size 7.4 microns. The size of a single voxel at maximum resolution is 350 nm.

Laboratory 108

The purchase of the device was supported by the project: “Hi-tech laboratory for advanced X-ray methods and tomography for the development of eco- and energy-saving technologies and technologies related to health” is implemented with the financial support of Operational Program “Development of the Competitiveness of the Bulgarian Economy” 2007 – 2013.